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美國耐諾Nanometrics
III-V族 化合物半導體制程控制 系統設備制造商,提供頂級設備檢測,光電組件磊晶過(guò)程之雜值濃度縱向分布量測儀(ECV) 、數字深層瞬時(shí)光譜儀(DLTS) 、霍爾效應量測完整系統(Hall system) 、光譜圖譜儀(PL) 、X射線(xiàn)衍射儀(x-ray) 、高速晶圓電阻系數分布圖量測系統

NANOMETRICS BRINGS YOU THE BROADEST ARRAY OF ADVANCED METROLOGIES IN THE INDUSTRY.主要產(chǎn)品
Nanometrics’ product lines offer an extensive array of proprietary technologies in optics, software and systems integration designed to meet the process control requirements of today’s advanced semiconductor technologies. These process control solutions are implemented on common metrology platforms that can be configured with a variety of measurement technologies, or as a single technology targeted for a specific process control application.